Webinar: Understanding Optical Resolution in THz Imaging
Each optical system is somewhat limited by its individual components performance, and Terahertz (THz) systems are no exception. To support and validate the ongoing development of INO's THz systems, proper characterization is needed.
In this webinar, Alex Paquet, Research Scientist for Imaging Systems at INO, will present the definitions and physics of imaging resolution as well as targets used for resolution tests such as bar charts, siemens star, slanted edge and point source. Alex will also discuss the effect of different optical system parameters and illumination such as the effect of source coherence on images.
Key takeaways:
- Resolution metrics and methods used to characterize the resolution of a THz optical system, and the test results obtained for each method
- Targets used for resolution tests such as bar charts, siemens star, slanted edge and point source
- Advantages and disadvantages of each test method and target
- The effect of different optical system parameters including source wavelength, optics f-number and field of view
- The effect of source coherence on images
Technical level
Speakers
Alex Paquet, Research Scientist for Imaging Systems, INO
Pierre Talbot, Business Development Manager, INO