NEP characterization and analysis method for THz imaging devices

The interest for see-through devices has grown in different market applications and the development of Terahertz (THz) imagers has progressed to satisfy those needs over the last decade. To achieve better estimation of the performance of the imaging device, it is important to have a clear understanding of the characterization method used to calculate the noise-equivalent power (NEP). Discover the NEP characterizations of INO’s Microxcam-384i camera in this paper.

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Marc Terroux, Pierre Talbot, Francis Généreux, Linda Marchese, El-Hassane Oulachgar, and Alain Bergeron "NEP characterization and analysis method for THz imaging devices", Proc. SPIE 11745, Passive and Active Millimeter-Wave Imaging XXIV, 117450L (12 April 2021);