Meet our team at SPIE, one of the largest optical science trade shows in North America.
We will have a live demo of our complete THz imaging system in our booth. You will be able to see for yourself the significant enhancement in the quality of the image produced by our camera.
Furthermore, you will be able to play firsthand with the new features for beam profiling applications. End users will be able to have instantaneous beam characteristics such as: center position, radii, height, width and tilt angle as well as gaussian fit of the image.
We will be present at booth 4452 from February 4th to 6th.