Infrared Characterization

We offer an infrared characterization service in the mid-wave infrared (MWIR) and long-wave infrared (LWIR) bands (i.e., 3 µm to 14 µm).

Cameras are characterized according to imaging performance standards such as responsivity, temporal noise, NETD, MTF, MRTD, and non-uniformities, which are representative of normal operating conditions. We use controlled environmental chambers with a temperature range of ‑40°C to +100°C and pressures that drop to less than 1 mTorr to simulate the operating conditions of military, airborne, and space systems. Cameras can be validated for specific applications in the required operating context, either in the field or at client sites.

INO can also conduct more extensive studies to determine a system’s static and dynamic behavior under various saturation conditions (low to high, constant, pulsed or flash, local or global). More generally, all our assemblies feature flexible designs able to reproduce specific operating conditions.

INO also offers the option of characterizing infrared detectors prior to their integration into a system. We can also develop the digitization, control, and communication electronics needed to operate the detector.

We have the capacity to adapt to specific client requirements to deliver short- and long‑range observation systems, thermal sights, based on cooled (MCT, InSb) and uncooled detectors (bolometers)

We closely  track the latest developments in the field, no matter where they happen. And we perform preliminary studies that help us assess potential solutions and lead to the construction and validation of demonstration devices. In this way, we’re able to produce simple, flexible, and compact adaptive optics systems to meet application requirements.

To fully assess a system’s suitability for a given application, other characteristics can also be measured, including power consumption (consumption or battery life in relation to ambient temperature), optical parameters (field of view, distortion, and magnification), and shock and vibration resistance.