NEP Characterization for Terahertz Imaging

One of the key features where INO differentiates itself from other solutions is the sensitivity (NEP). To better understand how the NEP is measured, watch the webinar.

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Webinar: NEP Characterization for Terahertz Imaging

The noise-equivalent power (NEP) is a widely accepted figure of merit used to compare the sensitivity performance of detectors. However, with no widely recognized standard for NEP, it is often difficult to have a fair comparison between different sensors. Having a clear understanding of the characterization method used to calculate this important metric will lead to better estimation of the performances that could be expected from an imaging device. 

In this webinar, Dr Hassane Oulachgar will present the NEP characterization of INO’s Microxcam-384i-THz camera over a wide frequency range. He will describe the measurement setup, as well as the details of the analysis method, including the estimation of the ENBW. Finally, he will present and discuss the NEP measurements of INO’s terahertz camera at wavelengths between 70 μm (4.5 THz) and 1.5 mm (198 GHz), demonstrating the broadband sensitivity of our camera.

Key takeaways:

  • NEP characterization of INO’s Microxcam-384i-THz camera
  • Description of the measurement setup
  • Values for the NEP

Speakers

Hassane Oulachgar

Senior Research Scientist, INO

Pierre Talbot

Pierre Talbot

Business Development Manager, INO

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